Email: krzysztof.gajewski@pwr.edu.pl

Unit: Faculty of Electronics, Photonics and Microsystems (N) » Department of Nanometrology

ul. Janiszewskiego 11/17, 50-372 Wrocław
building C-2, room 015
phone +48 71 320 3651

Office hours

Research fields

• Performing investigations using scanning probe microscopy (SPM); construction of STM / AFM microscopes and implementation of advanced SPM modes; 2D materials characterization.

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Recent papers

2018

• Gajewski K., Szymański W., Kaczorowski W., Niedzielski P., Gotszalk T., Quasi in-situ observation of the elastic properties changes of the graphene–low-density polyethylene composites, Diamond and Related Materials, 2 (82) 2018, 143-149, doi: 10.1016/j.diamond.2018.01.014

2017

• Kaczorowski W., Gajewski K., Szymanski W., Batory D., Wojciechowska A., Swiatek L., Gotszalk T., Niedzielski P., Evaluation of mechanical properties of carbon coatings synthesised in radio frequency plasma on PDMS, Surface and Coatings Technology, Vol. 333, 15 January 2018, 220-228, doi: 10.1016/j.surfcoat.2017.10.070
• Gajewski K., Piasecki T., Kopiec D., Gotszalk T., Development of the tunneling junction simulation environment for scanning tunneling microscope evaluation, Measurement Science and Technology, 3 (28), 23 January 2017, Article number 034012, doi: 10.1088/1361-6501/28/3/034012

2016

• Gajewski K., Szymański W., Niedzielski P., Gotszalk T., Kelvin Probe Force Microscopy investigations of High Strength Metallurgical Graphene transferred on low-density polyethylene, Microelectronic Engineering, Vol. 157, 1 May 2016, 71-77, doi: 10.1016/j.mee.2016.02.046
• Gajewski K., Goniszewski S., Szumska A., Moczała M., Kunicki P., Gallop J., Klein N., Hao L., Gotszalk T., Raman Spectroscopy and Kelvin Probe Force Microscopy characteristics of the CVD suspended graphene, Diamond and Related Materials, 4 (64) 2016, 27-33, doi: 10.1016/j.diamond.2016.01.008

Papers in DONA database